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SEM & TEM: Study the Surface & Interior Morphology

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Modules: Basic tools to study the surface and interior morphology Scanning Electron Microscope (SEM) Introduction to SEM Working Principle Basic Components of SEM (Magnetic Lenses, Scanning Coils Detectors Viewing CRT and Record CRT) Basic Modes of SEM (Secondary Electron Detection Mode, Backscattered Electron Detection Mode, X-Rays Detection Mode) Resolution of SEM Magnification of SEM Field Emission Scanning Electron Microscope (FESEM) Field Emission Gun Sample preparation and analysis Applications of SEM CLOSING THOUGHTS Transmission Electron Microscope (TEM) Introduction to TEM Working Principle Beam-Sample Interaction Imaging Modes in the TEM Sample preparation and analysis Microtomy Applications CLOSING THOUGHTS

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PKR 3,000.00
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